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PCB Jumper X-ray Inspection: Geometric Magnification and Pixel Sampling

PCB Jumper X-ray Inspection: Geometric Magnification and Pixel Sampling

At a glance

Distinguish geometric X-ray magnification, object sampling and focal-spot blur when reviewing PCB jumper solder-joint images.

Separate geometric X-ray magnification from display zoom. Geometric magnification is source-to-detector distance divided by source-to-object distance. Object-plane pixel sampling alone is not defect resolution, and screen enlargement cannot recover missing acquisition information.

Measure distances from the same source

Matsusada defines the ratio using focal-point-to-detector and focal-point-to-object distances. Hypothetical distances of 400 mm and 100 mm give M=4. The 300 mm object-to-detector gap is not the numerator.

Sampling is not defect resolution

With a hypothetical 100 micrometer detector pixel pitch and M=4, ideal object sampling is 25 micrometers. Focal spot, detector response, motion, contrast and processing also affect visible detail. This does not guarantee detection of every 25 micrometer void.

Account for focal-spot blur

XIMEA gives detector-plane geometric unsharpness as focal-spot size times (M minus 1). For an assumed 5 micrometer spot and M=4, that contribution is 15 micrometers at the detector, not total object resolution.

Retain target location and original images

Different target heights can have different source distances. Retain the target layer, distances, pixel pitch, tube conditions and acquisition settings. State whether the image supports location, comparison or quantification. Document crop, interpolation and sharpening.

Review records

ItemUnit or conditionRetain
Geometric MDimensionlessSource-detector/source-object
Object samplingMicrometersDetector pitch/M
Geometric blurMicrometersName the reference plane
Display zoomPercent or ratioDisplay processing

Products and related methods

surface mount PCB jumpers · Surface Mount PCB Jumper Microsections: Define the Cut Plane

Question

Does a larger screen improve acquired resolution? It can improve viewing but does not change acquisition geometry or sampling.

Sources

Matsusada geometric magnification;XIMEA source geometry and focal spot

The cover is an AI concept. Projection lines and shadows are not an exact ray diagram, real radiograph, equipment setup or defect evidence. No Hongchuan performance, equipment capability or test result is claimed.

Apply this to your component selection

Start with the product catalog and model guide. For a specific project, send the part number or drawing, quantity and key operating conditions. This article will be included in your enquiry for context.

Articles explain selection considerations and do not replace the confirmed drawing, test conditions or supply documents for a specific part. Check any cited source and its applicable edition for standards and parameters.